ITM adds NI-9202 compatibility to iTestSystem

The NI-9202 Voltage Input Module can now be used with the latest version of iTestSystem (16.1). The NI-9202 has excellent flexibility to meet the needs of your applications.  

The module has 16 simultaneous sampled, +-10 V, 24-bit differential input channels for creating large, distributed systems in a rugged form factor. The NI-9202 has a maximum sample rate of 10kS/s and features configurable filters to eliminate noise in your system while maintaining low-latency in control systems. 

Click Here for more information about iTestSystem.

For advice about using the NI-9202 versus other voltage modules in iTestSystem monitoring applications or with custom cRIO RT and FPGA control applications contact Mark Yeager or Chase Petzinger. 

iTestSystem Update: Joint Time Frequency Analysis Tool

Over the past few weeks we have been updating our Joint Time Frequency Analysis (JTFA) tool for iTestSystem. In general, the JTFA tool is used to show how the frequency content of a signal changes over time. This tool is particularly useful for analyzing and visualizing vibration and strain data on rotating machinery.

After using the JTFA tool on an internal data analysis project with a colleague, we realized that with a few additions and changes, the tool’s capabilities and processing efficiency could be greatly improved. To achieve this, we added a configurable overall frequency band algorithm for trending frequency bands related to specific machine fault or vibration modes. We also added templates for quickly developing and switching between frequency band signatures and settings. Finally, we added the capability to export the results to a data file for later viewing in TestView Plus or Excel.

These changes are included in the latest version of the JTFA tool. For a free trial of iTestSystem and the JTFA tool, contact chase.petzinger@itestsystem.com.

Building a Modern User Interface in LabVIEW

When we develop LabVIEW™ applications for our customers, a common request is for a simple, resizable and intuitive user interface (UI) for data visualization.  In these cases, we use a tree control and a subpanel.  This type of UI functions like a tab control that automatically resizes.  The main benefit of using a subpanel is to make your code more modular.

Figure 1: Modern User Interface with a Tree and Sub Panel.

To illustrate the modularity that this type of UI creates, I made an example LabVIEW™ project.  The main VI shown above uses a tree control to switch between a VI containing a graph and a VI containing a table.  I used our multi-queue event architecture for VI information communication messaging.  The image below shows the main VI’s significant functions.

Figure 2: Main VI’s Block Diagram – Significant Functions

The main VI’s functions are listed below.

Functions

  1. Initialize queues and events and then generate initialize event.
  2. Initialize tree and add tree items.
  3. When a user selects an item in the tree, generate data and then send it to the subpanel VI.
  4. Receive SubPanel Ready event from a subpanel VI and then insert the VI into the subpanel.
  5. Destroy queues and unregister for events.

In this example the subpanel VIs are very simple.  They populate an indicator (table or graph) and then generate a SubPanel Ready Event.  The two (2) subpanel VIs and block diagrams are shown below.

Figure 3: SubPanel VIs: Graph.vi and Table.vi

Contact Information: For more information on this example or our LabVIEW development service contact:

Mark Yeager – Integrated Test & Measurement (ITM), LLC.  Email: mark.yeager@itestsystem.com or Phone: 1.844.TestSys