Our iTestSystem customers who routinely acquire data with high channel counts and data from full-bridge transducers recently requested that we update the sensor auto-zero utility to improve test setup efficiency. In the latest version of iTestSystem, we updated the sensor auto-zero utility to include all channels that use the From Custom Scale option. […]
Over the years we have been tasked with identifying the root cause of machine structural failures. In many cases, we can determine the failure mode through strain and vibration testing, order analysis, modal analysis, and operating deflection shape analysis. What tests can you run when the damaging conditions are intermittent and not easily identified? In […]
This week we added another module to the iTestSystem compatibility list. One of our iTestSystem users recently needed to collect data from thirty-two (32), 4 to 20 mA current sensors along with their vibration measurements. National Instruments (NI) recently introduced a new C-Series current module, the NI-9253, that was a perfect fit for this application. […]
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iTestSystem Tip: Sensor Auto-zero Utility Update
in Blog Posts, iTestSystem Tips/by Chase Petzinger Our iTestSystem customers who routinely acquire data with high channel counts and data from full-bridge transducers recently requested that we update the sensor auto-zero utility to improve test setup efficiency. In the latest version of iTestSystem, we updated the sensor auto-zero utility to include all channels that use the From Custom Scale option. […]
Machine Failures Caused by Intermittent Damaging Events
in Aerospace | Defense, Automotive, Blog Posts, Civil | Infrastructure, Construction | Mining, Off-Highway, Power Generation, Pulp & Paper/by Mark YeagerOver the years we have been tasked with identifying the root cause of machine structural failures. In many cases, we can determine the failure mode through strain and vibration testing, order analysis, modal analysis, and operating deflection shape analysis. What tests can you run when the damaging conditions are intermittent and not easily identified? In […]
ITM adds NI-9253 Compatibility to iTestSystem
in Blog Posts/by Chase PetzingerThis week we added another module to the iTestSystem compatibility list. One of our iTestSystem users recently needed to collect data from thirty-two (32), 4 to 20 mA current sensors along with their vibration measurements. National Instruments (NI) recently introduced a new C-Series current module, the NI-9253, that was a perfect fit for this application. […]