When building large channel count DAQ systems, easy sensor channel editing is key. Edit multiple channels at once by using excel. Highlight the Channels item in the configuration tree. Export the channels to a CSV file. Open the CSV file in Microsoft Excel, then edit and save. Import the edited CSV file to update […]
We are pleased to announce that the NI-9203 current input module can now be used with iTestSystem and NI CompactDAQ. The NI-9203 features 8 current inputs , 16-bit resolution, +/- 20 mA range, 200 kS/s maximum sample rate in the C Series form factor. This module is intended for high-performance control and monitoring applications. The […]
As a part of our new ITM Live Demo series, we’re excited to release this video featuring our custom data acquisition and data logging solutions. During our 17 years in business, we’ve found that every test is a little bit different, especially in ruggedized environments. The best way to account for these custom problems is […]
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iTestSystem Tips: Modify Multiple Channels with Excel
in Blog Posts, iTestSystem Tips/by Mark Yeager When building large channel count DAQ systems, easy sensor channel editing is key. Edit multiple channels at once by using excel. Highlight the Channels item in the configuration tree. Export the channels to a CSV file. Open the CSV file in Microsoft Excel, then edit and save. Import the edited CSV file to update […]
ITM adds NI-9203 Compatibility to iTestSystem
in Announcements, iTestSystem Tips/by Mark YeagerWe are pleased to announce that the NI-9203 current input module can now be used with iTestSystem and NI CompactDAQ. The NI-9203 features 8 current inputs , 16-bit resolution, +/- 20 mA range, 200 kS/s maximum sample rate in the C Series form factor. This module is intended for high-performance control and monitoring applications. The […]
ITM Live Demo Series: Customer DAQ
in Announcements, Video/by Mark YeagerAs a part of our new ITM Live Demo series, we’re excited to release this video featuring our custom data acquisition and data logging solutions. During our 17 years in business, we’ve found that every test is a little bit different, especially in ruggedized environments. The best way to account for these custom problems is […]