One of the highlights of our summer at ITM is our trek to NI Week, the annual conference in Austin, Texas, presented by National Instruments where thousands of the world’s brightest minds in engineering and science come together to learn about the latest technology in our field.
For the last couple of years, we’ve had the privilege to not just attend but also to present during the interactive technical sessions. This year’s co-presentation on developing a Rugged Data Acquisition solution gave me the chance to share how ITM’s line of Rugged Data Acquisition (RAC) Systems allow us (and our customers) to gather data under even the harshest testing conditions.
Our portable RAC Systems include our LabVIEW-based iTestSystem software and can withstand environmental elements, shock and vibration in the field. Among the many features — whether you need to measure strain, acceleration, voltage, speed or temperature — these units can store terabytes of data that is all synched.
I love talking up the products that come out of our lab at ITM, but getting to share more about our Rugged DAQ solutions in a forum like NI Week takes it to the next level. I’m already looking forward to returning to Austin in 2015.
— ITM President Tim Carlier