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Identify Damaging Events with Statistical Analysis

Quickly Identify Significant Events in Large Data Sets with Statistical Analysis

Use statistical analysis for TestView Plus and Automated Analytics to extract statistics like minimum, maximum, and mean from each sensor.  The results of the selectable analysis is embedded within the data file as searchable meta data.

Automated Analytics users can quickly identify data files within large data sets that contain sensor events of interest.  When paired with Trigger Analysis and the Notification Service, these data files can be automatically selected and sent via email in remote monitoring applications.

About iTestSystem 

iTestSystem is an engineering measurement software platform that enables test engineers to organize, acquire, view, and analyze data from machinery, processes, vehicles and other complex systems.  iTestSystem was specifically designed for use with NI cDAQ or FieldDAQ hardware for data collection and data logging. 

For more information about our iTestSystem or ITM’s testing services, contact Ryan Welker @ (844) 837-8797 x702.