Posts

iTestSystem Tip: Sensor Auto-zero Utility Update

Our iTestSystem customers who routinely acquire data with high channel counts and data from full-bridge transducers recently requested that we update the sensor auto-zero utility to improve test setup efficiency.   In the latest version of iTestSystem (16.1.0.29), we updated the sensor auto-zero utility to include all channels that use the From Custom Scale option.  This update enables users to quickly adjust selected channel offsets with only a few mouse clicks.

One of our test engineers recently used this feature to test and calibrate a new load cell design for measuring loads in a manufacturing process.  He was able to quickly calibrate and zero the strain gauges along with a calibrated load cell and a pressure transducer prior to testing and before each directional test. The offset values are included in the calibration data files for traceability.

Contact Information: For more information about this update or iTestSystem contact:

Chase Petzinger – Integrated Test & Measurement (ITM), LLC. Email: chase.petzinger@itestsystem.com or Phone: 1.844.TestSys

Troubleshooting Machine Failures Caused by Intermittent Damaging Events

Over the years we have been tasked with identifying the root cause of machine structural failures. In many cases, we can determine the failure mode through strain and vibration testing, order analysis, modal analysis, and operating deflection shape analysis.  What tests can you run when the damaging conditions are intermittent and not easily identified?

In these cases, we like to install a cellular networked temporary data acquisition (DAQ) system that can autonomously log vibration and strain data along with machine status data. We have deployed two types of DAQ systems to collect data remotely.  An interactive system that includes an industrial PC running our iTestSystem software and National Instruments (NI) Compact DAQ hardware and a headless system that utilizes NI Compact RIO hardware.  Our test engineers prefer using the interactive solution for troubleshooting because they can view real-time signal waveforms and collected data files, and then adjust the test parameters accordingly without having to reprogram the hardware.

Figure 1: Headless networked data acquisition system

When potentially damaging events are identified in the vibration and strain data collected by these systems, it is important to know the machine’s operating status. Collecting the machine status information is just as important as collecting the structural data.  Many machines transmit these operating variables and operating stages over their network/bus.  Recently we have recorded process data from Allen Bradley Control Logix PLCs via Ethernet/IP, mining machine data from a Siemens controller via proprietary TCP/IP protocol, boiler condition data from a DCS via Modbus TCP,  machine pressures from PI historian via the UFL connector (TCP), and vehicle speeds and pressure via CAN.  Fortunately, we were able to use and adapt LabVIEW communication protocol tools to build applications and addons that allow this network tag data to be collected along with structural data.

Figure 2: Modbus to Shared Variable Tool

After the data collection phase, our engineers perform statistical analysis on the sensor and status channels in all data files and aggregate the results into a database for searchability. To identify the root cause probabilities, you can process the channel statistics data using your favorite correlation algorithm or application.  The image below shows an example data set containing related sensor data that was processed using a LabVIEW correlation test tool.

Figure 3: Correlation Test Example vi

Contact Information: For more information about our remote data acquisition service, our LabVIEW development service, or iTestSystem contact:

Mark Yeager – Integrated Test & Measurement (ITM), LLC.  Email: mark.yeager@itestsystem.com or Phone: 1.844.TestSys

ITM adds FieldDAQ Sound & Vibration Module compatibility to iTestSystem

The FieldDAQ™ FD-11634 sound and vibration input module from National Instruments (NI) can now be used with the latest version of iTestSystem (16.1.24).  The FD-11634 is similar to the NI-9234, NI-9232, NI-9231, and NI-9230 cDAQ dynamic input modules and can be used with IEPE type sensors such as accelerometers and microphones.  Like the other FieldDAQ™ modules, this module is IP65/IP67 dust and water resistant with an operating temperature range of  -40 °C to 85 °C.  Our test engineers would use these modules for collecting vibration data on mining and construction equipment, vibration data on rotating machinery within manufacturing facilities and test cells, and acoustic data for measuring equipment noise emissions.

The FieldDAQ™ FD-11634 module has 8 simultaneous sampled, ±1V or ±10 V, 24-bit differential input channels with AC/DC coupling. It has a maximum sample rate of 102.4kS/s and features built in anti-aliasing filters that automatically adjust to the sampling rate.

For advice about using the FieldDAQ™ FD-11634 sound and vibration modules in iTestSystem monitoring applications or with custom cRIO RT and FPGA control applications contact Mark Yeager or Chase Petzinger.

Click Here to view a video showing one of our test engineer collecting data from a submerged FieldDAQ™ module with iTestSystem.

Click Here for more information about iTestSystem.

Machine Design Article: Feeding the Next Generation of Product Development

Check out the article “Feeding the Next Generation of Product Development” in Machine Design magazine.  In this article, ITM president Tim Carlier describes how engineers are collecting real-world data to get a true look at how their designs are used in the field, and how to design a better machine.  By utilizing iTestSystem and its automation tools, test engineers can implement unattended field tests that continuously analyze and send data based on specific operating conditions.  Armed with data from these tests, designers can better quantify and predict future performance and develop products that satisfy the complete range of actual customer usage.

ITM adds NI-9203 compatibility to iTestSystem

We are pleased to announce that the NI-9203 current input module can now be used with iTestSystem and NI CompactDAQ.

The NI-9203 features 8 current inputs , 16-bit resolution, +/- 20 mA range, 200 kS/s maximum sample rate in the C Series form factor.  This module is intended for high-performance control and monitoring applications. The NI-9203 uses multiplexed sampling and an SAR type ADC.

For advice about using the NI-9203 versus other current modules in iTestSystem monitoring applications or with custom cRIO RT and FPGA control applications contact Mark Yeager or Chase Petzinger.

ITM Live Demo Series: Customer DAQ

As a part of our new ITM Live Demo series, we’re excited to release this video featuring our custom Data Acquisition solutions. During our 17 years in business, we’ve found that every test is a little bit different, especially in ruggedized environments. The best way to account for these custom problems is to create a custom solution.

Watch now to see as I demonstrate some of the features available with a custom DAQ and explain how this may be just the solution you’re looking for.

If you’re interested in learning more about how a custom DAQ solution built by ITM can help meet your specific testing needs, feel free to contact one of our test specialists by e-mail at info@itestsystem.com or phone at (844) 837-8797.