Entries by Mark Yeager

Roving Accelerometer Impact Tests with iTestSystem

In order to prevent or troubleshoot structural vibration problems, it is important to characterize a structure’s dynamic behavior using both experimental and Finite Element Analysis (FEA) technologies.  One method used to identify a structure’s vibration modes is to perform a roving accelerometer or roving hammer impact test.  In an impact test, engineers measure the response of a structure from an impulse delivered by a […]

ITM @ VIATC 2019: Vibration Institute Annual Training Conference

 Come see us at the VIATC 2019 Exhibit Hall in Booth 33! Ryan Welker and Mark Yeager (CAT III Vibration Analysts) will be there to answer questions about our iTestSystem engineering measurement platform, our on-site testing services, LabVIEW consulting, and strain gauging services. When: July 24 & 25th Where: The VIATC 2019 conference and […]

Strain Gauge Shunt Equivalent Calculations in iTestSystem

When making strain measurements it is important to perform a shunt calibration both before and after the actual measurements are acquired.  Shunt calibrations ensure accurate strain measurements by adjusting the sensitivity or gain of the data acquisition equipment to compensate for leadwire resistance and other scaling errors. iTestSystem takes advantage of the shunt calibration circuits […]

Developing Custom Applications for iTestSystem

 As the global market moves steadily in the direction of increased productivity through integration of software into the world of testing services, Integrated Test & Measurement finds itself at the forefront of the field.  Our other LabVIEW developers and I have been hard at work creating custom applications to help customers meet their testing needs […]

Building a Modern User Interface in LabVIEW

When we develop LabVIEW™ applications for our customers, a common request is for a simple, resizable and intuitive user interface (UI) for data visualization.  In these cases, we use a tree control and a subpanel.  This type of UI functions like a tab control that automatically resizes.  The main benefit of using a subpanel is […]

Archiving CompactRIO Process Data to PI

The tool we most commonly use for real-time embedded process monitoring and control applications is the NI CompactRIO.  These controllers allow us to embed algorithms that acquire and analyze high speed process sensor data and then output derived key performance indicators (KPIs) to other control systems.  Most of the time, our customers also require us  […]

ITM adds NI-9242 compatibility to iTestSystem

   The NI-9242 single ended voltage input module can now be used with the latest version of iTestSystem (16.1). The NI-9242 C-Series module features three (3) voltage inputs plus one (1) neutral input, 24-bit resolution, 250V rms L-N, 400V rms L-L, and 50 kS/s/ch. The measurement range (250V rms L-N or 400V rms L-L) […]

ITM adds NI-9246 compatibility to iTestSystem

  In the latest release of iTestSystem (v 16.1), we are adding the NI-9246 current input module to the compatibility list. The NI-9246 features 3, 22 Arms continuous current inputs, 24-bit resolution, and 50 kS/s/ch in the C Series form factor. The measurement range (22 Arms ) makes it ideal for three phase current measurements from 1A […]