iTestSystem Applications

This category contains iTestSystem platform main applications for configuring sensor channels, as well as collecting, viewing, and analyzing data.

iTestSystem Application: TestView Plus

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Tach Signal in TestView Plus

TestView Plus is an iTestSystem application for quick and easy viewing and analysis of data recorded in .TDMS files.  Test engineers can open data files and then simply drag and drop data channels into a variety of graphs and tables.  Data plotting algorithms allow for viewing and zooming into even the largest data files without running into memory issues.

TestView Plus has many features that allow test engineers to manage multiple data analysis projects at once.  TestView Plus Sessions allow for fast transitions between data processing projects.  A Session retains the current tab and graph information, analysis files, and data workspace.  TestView Plus Windows and Tabs allow for quickly adding and ordering new and existing data views.  The TestView Plus Reporting Utility allows for simple customized layouts sized to fit neatly in a report or presentation.

Besides data viewing, TestView Plus also provides access to the iTestSystem analysis functions.  Data analysis can be performed on data in an active Time History graph.  To run an Analysis tool, select an icon in the Analysis toolbar or select an option in the “Analysis” dropdown in menu toolbar.  Once the analysis is performed, the results will be graphed in a new window.

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iTestSystem Application: MultiDAQ

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iTestSystem MultiDAQ

MultiDAQ is a configurable general data logging and real-time data viewing application for iTestSystem (iTS).  An intuitive user interface allows test technicians and engineers to choose sensor channels, synchronize DAQ hardware,  change sample rates,  setup input data filters, configure data file triggering, and manage automated data file naming.  Once configured, MultiDAQ provides graphical, tabular, and digital real-time data views for test operators to visualize data trends during the data collection process.

Function List

  • Stream data from multiple C-series NI chassis.
  • Stream data at different sample rates.
  • View real-time data, including RMS and waveform data in tables, graphs, colormaps, spectra, and waterfall graphs.
  • Alarm when signals exceed channel’s minimum or maximum values.
  • Trigger acquisitions based on custom duration or value trigger statements.

For more information about MultiDAQ or iTestSystem, contact Chase Petzinger via email at chase.petzinger@itestsystem.com.

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iTestSystem Application: Archive Manager

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iTestSystem's Archive Manager Application

Managing data from autonomous data acquisition systems that generate megabyte and gigabyte data files can be a challenge. iTestSystem’s Archive Manager application simplifies this data collection challenge by allowing users to configure a local directory as a data file FIFO and a separate directory (usually on a USB drive) as a data archive.

When enabled, Archive Manager solves two problems common to DAQ systems: system crashes due to a full hard drives and removeable drive (USB/network drive) management.  The Archive Manager allows users to set a limit on the amount of data stored in a specific directory. It monitors this directory and removes older files to accommodate new data files (data file FIFO).  This application keeps track of all data files removed from the watch directory and all files moved to the archive directory.  This allows users to swap removeable drives on the fly without duplicating data files in the archive or interacting with the DAQ system’s HMI.

Another feature of the Archive Manager application that ensures autonomous DAQ system stability is the configuration backup process.  When enabled, the configuration backup service periodically copies all files added in the log file list to the archive directory.  Backing up files like the iTestSystem configuration file allows test engineers to keep track of setup changes that occur during a test or data logging project and restore previous configurations.

For more information about the iTestSystem Archive Manager or iTestSystem, contact Chase Petzinger via email at chase.petzinger@itestsystem.com.

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Vibration and Strain Gauge Level Report Automation with iTestSystem

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Our test engineers are often called upon to deploy unattended or “black box” data acquisition systems in the field.  These systems are deployed on machinery, vehicles, and industrial processes to constantly record strain and vibration data at sample rates between 100 and 100,000 Hz. That adds up to a lot of data to sift through.

In situations where we are trying to identify system operation outliers or damaging events, we utilize the Automated Analytics application in iTestSystem to limit the amount of data searches required. The Automated Analytics application allows users to analyze, build, and send sensor level reports only when specific vibration and strain limits are exceeded.  Instead of searching through data files, engineers can easily review the report and download relevant data files from deployed systems for further analysis.

This video demonstrates how to build and send vibration and strain reports using Automated Analytics and other iTestSystem tools and applications.

For more information about our iTestSystem or ITM’s testing services, contact Ryan Welker @ (844) 837-8797 x702.

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iTestSystem Tip: Strain Gauge Rosette Analysis

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When troubleshooting structural failures or validating FEA models through testing, strain gauge rosettes are used to find the full state of strain at areas of concern around the structure.  iTestSystem’s Rosette Analysis tool is used to calculate the principal strain, principal strain angle, shear strain, principal stress, and other values from strain gauge rosette data. This video shows how to use the Rosette analysis tool.

For questions about using the Rosette Analysis tool or other iTestSystem analysis tools contact Chase Petzinger.

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iTestSystem Tip: Sensor Auto-zero Utility Update

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Our iTestSystem customers who routinely acquire data with high channel counts and data from full-bridge transducers recently requested that we update the sensor auto-zero utility to improve test setup efficiency.   In the latest version of iTestSystem, we updated the sensor auto-zero utility to include all channels that use the From Custom Scale option.  This update enables users to quickly adjust selected channel offsets with only a few mouse clicks.

One of our test engineers recently used this feature to test and calibrate a new load cell design for measuring loads in a manufacturing process.  He was able to quickly calibrate and zero the strain gauges along with a calibrated load cell and a pressure transducer prior to testing and before each directional test. The offset values are included in the calibration data files for traceability.

Contact Information: For more information about this update or iTestSystem contact:

Chase Petzinger – Integrated Test & Measurement (ITM), LLC. Email: chase.petzinger@itestsystem.com or Phone: 1.844.TestSys

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Roving Accelerometer Impact Tests with iTestSystem

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3D Animator: Bike Frame Twist Vibration Mode at 26.2 Hz

In order to prevent or troubleshoot structural vibration problems, it is important to characterize a structure’s dynamic behavior using both experimental and Finite Element Analysis (FEA) technologies.  One method used to identify a structure’s vibration modes is to perform a roving accelerometer or roving hammer impact test.  In an impact test, engineers measure the response of a structure from an impulse delivered by a calibrated hammer using tri-axial accelerometers.

FRF View: Bike Frame Point 9 Coherence & Magnitude

Managing impact tests on large structures can be tedious and cost prohibitive, since they require collecting accelerometer responses at hundreds of locations to resolve the vibration motion.  Not only do test engineers need to keep track of the locations, they also need to keep track of the orientation that an accelerometer is positioned.

Our test engineers have found that the most efficient and cost effective solution for collecting impact data is to use a National Instruments (NI) cDAQ chassis with either NI-9234, NI-9232, NI-9231 or NI-9230 IEPE modules along with a calibrated impulse hammer and between 3 – 9 tri-axial accelerometers. To collect, manage, and visualize the modal data, our LabVIEW software engineers developed the Impact Test DAQ, FRF Viewer, and 3D Animator applications for our iTestSystem software platform. These applications incorporate tools that our test engineers need to manage and validate the quality of their modal data while in the field.

For more information about impact tests, modal analysis, our iTestSystem Impact Test applications, or to schedule a modal test contact Mark Yeager or Ryan Welker.

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FieldDAQ Sound & Vibration Module compatibility added to iTestSystem

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The FieldDAQ™ FD-11634 sound and vibration input module from National Instruments (NI) can now be used with the latest version of iTestSystem for your data collection needs.  The FD-11634 is similar to the NI-9234, NI-9232, NI-9231, and NI-9230 cDAQ dynamic input modules and can be used with IEPE type sensors such as accelerometers and microphones.  Like the other FieldDAQ™ modules, this module is IP65/IP67 dust and water resistant with an operating temperature range of  -40 °C to 85 °C.  Our test engineers would use these modules for collecting vibration data on mining and construction equipment, vibration data on rotating machinery within manufacturing facilities and test cells, and acoustic data for measuring equipment noise emissions.  No matter your need, data logging with this equipment is sure to impress.

The FieldDAQ™ FD-11634 module has 8 simultaneous sampled, ±1V or ±10 V, 24-bit differential input channels with AC/DC coupling. It has a maximum sample rate of 102.4kS/s and features built in anti-aliasing filters that automatically adjust to the sampling rate.

For advice about using the FieldDAQ™ FD-11634 sound and vibration modules in iTestSystem monitoring applications or with custom cRIO RT and FPGA control applications contact Mark Yeager or Chase Petzinger.

Click Here to view a video showing one of our test engineer collecting data from a submerged FieldDAQ™ module with iTestSystem.

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iTestSystem Tip: Impact Hammer Setup

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While iTestSystem is designed to collect data from specific sensor types like strain, voltage, current, and accel; custom signal types such as pressure, displacement, and force can also be configured by utilizing the Custom Scale functionality during the channel creation process.

For example, manufacturers often need to measure the amount of force required to install a component using a calibrated impact hammer.  Since iTestSystem does not have a specific channel type for impact hammers, we must create one using a similar channel type.  The channel type most similar to an impact hammer is the accelerometer channel.1

To configure a piezoelectric impact hammer in iTestSystem, first create an accelerometer channel.  An accelerometer channel will supply the impact hammer with IEPE constant current.  From the accelerometer configuration window, change the Units to “From Custom Scale”, set the sensitivity to 1, and set the sensitivity units to Volt/g.  Next, set the custom scale: scaled units to lbs, lbf, or N, Prescaled Units to g, and in the slope field, input the lbs/Volt value from the hammer’s calibration sheet.  After entering these settings, be sure to hit the Test button to verify your signal and save the settings after verification.

Notes

  1. Most impact hammers are piezoelectric and require IEPE constant current excitation.  Several iTestSystem compatible National Instruments (NI) cDAQ input modules (NI-9230, NI-9231, NI-9232, and NI-9234) can supply IEPE excitation for an impact hammer.  These modules are typically used for piezoelectric accelerometer inputs.

For a free trial of iTestSystem including the custom scale settings or to learn more about impact hammer measurements, contact chase.petzinger@itestsystem.com.

Strain Gauge Shunt Equivalent Calculations in iTestSystem

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When making strain measurements it is important to perform a shunt calibration both before and after the actual measurements are acquired.  Shunt calibrations ensure accurate strain measurements by adjusting the sensitivity or gain of the data acquisition equipment to compensate for leadwire resistance and other scaling errors.

iTestSystem takes advantage of the shunt calibration circuits included in the National Instruments (NI) cDAQ strain modules.  The NI-9235, NI-9236, and NI-9237 strain modules contain an internal shunt resistor that when switched on “shunts” across one leg of the strain circuit’s wheatstone bridge.  When active, the shunt resistor offsets the strain measurement by a constant strain which is calculated using the equivalent shunt calculation.  The equivalent strain/shunt value is dependent on the strain gauge configuration, gauge resistance, shunt resistance, gauge factor, and material properties.

In the latest version of iTestSystem, we added a built-in strain gauge shunt equivalent calculator that can be accessed from the strain configuration page.  This calculator has allowed us to speed up the calibration process and eliminate hand calculation errors.

For a free trial of iTestSystem and the equivalent shunt calculation tool, contact chase.petzinger@itestsystem.com.

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