iTestSystem Applications

This category contains iTestSystem platform main applications for configuring sensor channels, as well as collecting, viewing, and analyzing data.

Strain Gauge Shunt Equivalent Calculations in iTestSystem

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When making strain measurements it is important to perform a shunt calibration both before and after the actual measurements are acquired.  Shunt calibrations ensure accurate strain measurements by adjusting the sensitivity or gain of the data acquisition equipment to compensate for leadwire resistance and other scaling errors.

iTestSystem takes advantage of the shunt calibration circuits included in the National Instruments (NI) cDAQ strain modules.  The NI-9235, NI-9236, and NI-9237 strain modules contain an internal shunt resistor that when switched on “shunts” across one leg of the strain circuit’s wheatstone bridge.  When active, the shunt resistor offsets the strain measurement by a constant strain which is calculated using the equivalent shunt calculation.  The equivalent strain/shunt value is dependent on the strain gauge configuration, gauge resistance, shunt resistance, gauge factor, and material properties.

In the latest version of iTestSystem, we added a built-in strain gauge shunt equivalent calculator that can be accessed from the strain configuration page.  This calculator has allowed us to speed up the calibration process and eliminate hand calculation errors.

For a free trial of iTestSystem and the equivalent shunt calculation tool, contact chase.petzinger@itestsystem.com.

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iTestSystem Update: Joint Time Frequency Analysis Tool

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Over the past few weeks we have been updating our Joint Time Frequency Analysis (JTFA) tool for iTestSystem. In general, the JTFA tool is used to show how the frequency content of a signal changes over time. This tool is particularly useful for analyzing and visualizing vibration and strain data on rotating machinery.

After using the JTFA tool on an internal data analysis project with a colleague, we realized that with a few additions and changes, the tool’s capabilities and processing efficiency could be greatly improved. To achieve this, we added a configurable overall frequency band algorithm for trending frequency bands related to specific machine fault or vibration modes. We also added templates for quickly developing and switching between frequency band signatures and settings. Finally, we added the capability to export the results to a data file for later viewing in TestView Plus or Excel.

These changes are included in the latest version of the JTFA tool. For a free trial of iTestSystem and the JTFA tool, contact chase.petzinger@itestsystem.com.

ITM Live Demo Series: Configuring Ethernet Chassis in NI Max

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The latest video in the ITM Live Demo series shows users how to configure an Ethernet/Network cDAQ or FieldDAQ chassis with NI Measurement & Automation Explorer (NI Max).

One of the most common questions we get from iTestSystem users; How do I configure my network/ethernet cDAQ or FieldDAQ chassis?  In this video, Chase Petzinger demonstrates how to change a cDAQ’s network settings.

If you’re interested in learning more about iTestSystem and networked cDAQ chassis measurements, feel free to contact one of our test specialists by e-mail at info@itestsystem.com or phone at (844) 837-8797.

ITM Live Demo Series: Sound Level Measurements with iTestSystem

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The latest video in the ITM Live Demo series shows the new sound level measurement capability of iTestSystem.

In recent months, our customers have asked us to integrate sound level measurements into iTestSystem.  With this new feature, iTestSystem can help you monitor construction site noise or measure whether your equipment meets ISO noise emission standards or pass by noise regulations. In this video, Ryan Matthews demonstrates the new dataview for iTestSystem to measure a fan’s sound level.

If you’re interested in learning more about iTestSystem and Sound Level Measurements, feel free to contact one of our test specialists by e-mail at info@itestsystem.com or phone at (844) 837-8797.

ITM Live Demo Series: iTestSystem with NI FieldDAQ

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As a part the ITM Live Demo series, we’re excited to release this video featuring iTestSystem and National Instruments FieldDAQ™ hardware to assist with your data collection projects.

At ITM, we’re always on the lookout for tools that will help us take tough measurements.  When we heard that NI was introducing a new device that features IP65/67-rated ingress protection, we were very excited.  In many industrial or off-way environments, there is potential for fluids to splash or leak onto exposed hardware.  Could the NI FieldDAQ™ be a solution for these types of environments?

Watch now as I demonstrate how to use an NI FieldDAQ™ Strain Device with iTestSystem for data logging and answer the question; Will it work while submerged in water?

If you’re interested in learning more about iTestSystem or FieldDAQ™, feel free to contact one of our test specialists by e-mail at info@itestsystem.com or phone at (844) 837-8797.

iTestSystem Tip: Start and Stop Tests with MultiDAQ Trigger

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When deploying a DAQ system for unattended testing, use the MultiDAQ trigger function in iTestSystem to automate data collection.  Data collection starts when the start trigger condition is met.  Data collection stops when the stop trigger condition is met.
Follow the steps below to enable and configure triggering.
  1. Enable auto save
  2. Enable triggering
  3. Build a start trigger statement
  4. Build a stop trigger statement
  5. Start configured MultiDAQ
  6. Let MultiDAQ simplify your data logging..

iTestSystem Tips: Modify Multiple Channels with Excel

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When building large channel count DAQ systems, easy sensor channel editing is key.  Edit multiple channels at once by using excel. Highlight the Channels item in the configuration tree. Export the channels to a CSV file. Open the CSV file in Microsoft Excel, then edit and save. Import the edited CSV file to update the configuration file with the channel changes.
For more information about iTestSystem, contact Chase Petzinger @ (844) 837-8797 x704

ITM adds NI-9203 Compatibility to iTestSystem

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We are pleased to announce that the NI-9203 current input module can now be used with iTestSystem and NI CompactDAQ.

The NI-9203 features 8 current inputs , 16-bit resolution, +/- 20 mA range, 200 kS/s maximum sample rate in the C Series form factor.  This module is intended for high-performance control and monitoring applications. The NI-9203 uses multiplexed sampling and an SAR type ADC.

For advice about using the NI-9203 versus other current modules in iTestSystem monitoring applications or with custom cRIO RT and FPGA control applications contact Mark Yeager or Chase Petzinger.

ITM adds NI-9217 compatibility to iTestSystem

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NI 9217 RTD cDAQ Module

We are pleased to announce that the NI-9217 resistance temperature detector (RTD) analog input module can now be used with iTestSystem and NI CompactDAQ.  The NI-9217 features 4 analog inputs, 24-bit resolution, and an aggregate sampling rate of 5 S/s (1.25 S/s per channel) in high accuracy mode.  The high accuracy mode has built in 50/60 Hz noise rejection and less than a 1 °C accuracy error over its entire operating temperature range.

Tip: Since the NI-9217 is the first CompactDAQ RTD module on the compatibility list,  a new RTD channel type was added to iTestSystem.  Right click on Channels in the project tree and select Create New > RTD.

For more information, visit https://3.133.116.34

Tip: Adding Cursors to TestView+ Graphs

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testview-cursor

Quickly add cursors to your iTestSystem’s TestView+ graph by right clicking near the location that you want to add the cursor and select Cursors: Add Cursor.

Click here or point your browser to /products/software/itestsystem-20-0/ to download your free copy.