Tag Archive for: iTestSystem

iTestSystem Tip: Impact Hammer Setup

in , /by

ï»żï»ż

While iTestSystem is designed to collect data from specific sensor types like strain, voltage, current, and accel; custom signal types such as pressure, displacement, and force can also be configured by utilizing the Custom Scale functionality during the channel creation process.

For example, manufacturers often need to measure the amount of force required to install a component using a calibrated impact hammer.  Since iTestSystem does not have a specific channel type for impact hammers, we must create one using a similar channel type.  The channel type most similar to an impact hammer is the accelerometer channel.1

To configure a piezoelectric impact hammer in iTestSystem, first create an accelerometer channel.  An accelerometer channel will supply the impact hammer with IEPE constant current.  From the accelerometer configuration window, change the Units to “From Custom Scale”, set the sensitivity to 1, and set the sensitivity units to Volt/g.  Next, set the custom scale: scaled units to lbs, lbf, or N, Prescaled Units to g, and in the slope field, input the lbs/Volt value from the hammer’s calibration sheet.  After entering these settings, be sure to hit the Test button to verify your signal and save the settings after verification.

Notes

  1. Most impact hammers are piezoelectric and require IEPE constant current excitation.  Several iTestSystem compatible National Instruments (NI) cDAQ input modules (NI-9230, NI-9231, NI-9232, and NI-9234) can supply IEPE excitation for an impact hammer.  These modules are typically used for piezoelectric accelerometer inputs.

For a free trial of iTestSystem including the custom scale settings or to learn more about impact hammer measurements, contact chase.petzinger@itestsystem.com.

DOT Structural Health Monitoring

in , /by

ï»żï»ż

As engineering consultants, it’s the nature of our business for our work to take us out on the open road. It is for this reason that we are proud to support several state Departments of Transportation (DOT) with their structural testing and data acquisition needs.  We travel the very roads, bridges and other major infrastructure that they work so hard to design, build and maintain. 

Over the years, our field-testing experts have provided DOTs with the manpower needed to install and maintain the structural sensors for monitoring bridge and infrastructure usage/health, as well as the custom enclosures that house the precision data acquisition (DAQ) equipment used to process and trend data from the structural sensors.  We are looking for more opportunities to provide DOTs with the manpower and tools needed to keep tabs on our aging infrastructure.  

If you need help or advice on a structural monitoring project, contact Ryan Welker (ryan.welker@itestsystem.com or 1.844.837.8797 x702).  

We Build Rugged Data Acquisition Systems

in , /by

 

Save time and money by leveraging ITM’s experience for your data acquisition system needs. Our engineers can assist you with choosing the best DAQ hardware and packaging for your testing conditions. Our iTestSystem software can complement your hardware to provide a complete testing solution. Contact ITM today to learn more!

Contact Us

Contact Info: Ryan Welker, 513.405.0181

 

Strain Gauge Shunt Equivalent Calculations in iTestSystem

in , /by

When making strain measurements it is important to perform a shunt calibration both before and after the actual measurements are acquired.  Shunt calibrations ensure accurate strain measurements by adjusting the sensitivity or gain of the data acquisition equipment to compensate for leadwire resistance and other scaling errors.

iTestSystem takes advantage of the shunt calibration circuits included in the National Instruments (NI) cDAQ strain modules.  The NI-9235, NI-9236, and NI-9237 strain modules contain an internal shunt resistor that when switched on “shunts” across one leg of the strain circuit’s wheatstone bridge.  When active, the shunt resistor offsets the strain measurement by a constant strain which is calculated using the equivalent shunt calculation.  The equivalent strain/shunt value is dependent on the strain gauge configuration, gauge resistance, shunt resistance, gauge factor, and material properties.

In the latest version of iTestSystem, we added a built-in strain gauge shunt equivalent calculator that can be accessed from the strain configuration page.  This calculator has allowed us to speed up the calibration process and eliminate hand calculation errors.

For a free trial of iTestSystem and the equivalent shunt calculation tool, contact chase.petzinger@itestsystem.com.

Download iTestSystem

Developing Custom Applications for iTestSystem

in /by

ï»żï»ż

As the global market moves steadily in the direction of increased productivity through integration of software into the world of testing services, Integrated Test & Measurement finds itself at the forefront of the field.  Our other LabVIEW developers and I have been hard at work creating custom applications to help customers meet their testing needs with more efficiency and cost-effectiveness than ever before.

Since many of my co-workers come from both test engineering and software development backgrounds, it’s easier for us to scope, build, and deploy these custom testing applications while working hand-in-hand with on-site operators and field engineers, or even sending our own engineers on-site to test the applications.  Past projects I’ve gotten to work on have ranged from a small data collection and viewing application that allows a customer to perform materials testing and quickly generate reports; to larger systems like a power quality application which utilizes our iTestSystem platform and allows the customer to collect and perform real time power-quality analysis on large genset engines, view and quickly confirm results, and create multiple types of reports for both internal and external customers.

Thanks to ITM’s iTestSystem platform, we have been able to leverage our pre-existing data acquisition, data viewing, and application distribution tools to create and distribute these applications both faster and at lower price points than many of our customers expected.  Having this base platform allows me to create and test solutions quickly and to make revisions with ease.  As a LabVIEW developer on Team ITM, I have enjoyed the unique challenges presented in these applications and look forward to seeing how ITM continues to lead the field in this market.

Contact Information: For more information about our LabVIEW application development service contact:

Mark Yeager – Integrated Test & Measurement (ITM), LLC.  Email: mark.yeager@itestsystem.com or Phone: 1.844.TestSys

Download iTestSystem

ITM adds NI-9202 compatibility to iTestSystem

in , /by

ï»żï»żï»żThe NI-9202 Voltage Input Module can now be used with the latest version of iTestSystem (16.1). The NI-9202 has excellent flexibility to meet the needs of your applications.  

The module has 16 simultaneous sampled, +-10 V, 24-bit differential input channels for creating large, distributed systems in a rugged form factor. The NI-9202 has a maximum sample rate of 10kS/s and features configurable filters to eliminate noise in your system while maintaining low-latency in control systems. 

Click Here for more information about iTestSystem.

For advice about using the NI-9202 versus other voltage modules in iTestSystem monitoring applications or with custom cRIO RT and FPGA control applications contact Mark Yeager or Chase Petzinger. 

iTestSystem Update: Joint Time Frequency Analysis Tool

in , , /by

ï»żï»ż

Over the past few weeks we have been updating our Joint Time Frequency Analysis (JTFA) tool for iTestSystem. In general, the JTFA tool is used to show how the frequency content of a signal changes over time. This tool is particularly useful for analyzing and visualizing vibration and strain data on rotating machinery.

After using the JTFA tool on an internal data analysis project with a colleague, we realized that with a few additions and changes, the tool’s capabilities and processing efficiency could be greatly improved. To achieve this, we added a configurable overall frequency band algorithm for trending frequency bands related to specific machine fault or vibration modes. We also added templates for quickly developing and switching between frequency band signatures and settings. Finally, we added the capability to export the results to a data file for later viewing in TestView Plus or Excel.

These changes are included in the latest version of the JTFA tool. For a free trial of iTestSystem and the JTFA tool, contact chase.petzinger@itestsystem.com.

DAQ Equipment Rental Service

in , /by

ï»żï»ż

Our engineers and technicians use National Instruments (NI) CompactDAQ (cDAQ) hardware and our iTestSystem software to collect structural, vibration, and temperature data for lab and field tests.  Many of these tests are unique and require different variations of data acquisition hardware and sensors types.  As you can imagine, we have accumulated quite an inventory of cDAQ test equipment and sensors from these tests to help with your data logging project.  This inventory includes both cDAQ chassis and C-Series voltage, strain, vibration, and temperature modules. 

For our iTestSystem users, we offer a data acquisition equipment rental service for available cDAQ hardware from our inventory.  If you need additional equipment to complete a design validation test or to troubleshoot a structural problem or complete other types of data collection, check with us to see what equipment is available. 

Click Here for more information about Equipment Rental. 

For more information about eligibility, equipment availability or to request a quote contact Josh.Fishback@iTestSystem.com. 

Archiving CompactRIO Process Data to PI

in , , , /by

The tool we most commonly use for real-time embedded process monitoring and control applications is the NI CompactRIO.  These controllers allow us to embed algorithms that acquire and analyze high speed process sensor data and then output derived key performance indicators (KPIs) to other control systems.  Most of the time, our customers also require us  to send the KPIs to a real-time data infrastructure like OSIsoft’s PI System so plant managers and engineers can use the data to find energy savings, monitor asset health, or optimize processes.

For our latest CompactRIO systems we have developed APIs that allow us to send or receive data directly to/from PI.  We utilize the PI Asset Framework and the UFL Connector to automatically generate PI tags from the device and update the process tag values either on value change or on a time basis.

These tools greatly simplify our CompactRIO to PI System communication process by eliminating intermediary data servers and automatically generating PI tags based on a CompactRIO system’s configuration.  If you are interested in using these APIs for PI or developing a CompactRIO system contact Mark Yeager or Chase Petzinger.

ITM Live Demo Series: Configuring Ethernet Chassis in NI Max

in , , /by

The latest video in the ITM Live Demo series shows users how to configure an Ethernet/Network cDAQ or FieldDAQ chassis with NI Measurement & Automation Explorer (NI Max).

One of the most common questions we get from iTestSystem users; How do I configure my network/ethernet cDAQ or FieldDAQ chassis?  In this video, Chase Petzinger demonstrates how to change a cDAQ’s network settings.

If you’re interested in learning more about iTestSystem and networked cDAQ chassis measurements, feel free to contact one of our test specialists by e-mail at info@itestsystem.com or phone at (844) 837-8797.