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You are here: Home1 / iTestSystem Blog2 / iTestSystem

Tag Archive for: iTestSystem

ITM adds NI-9244 compatibility to iTestSystem

in Announcements, Blog Posts/by Mark Yeager

 

We are pleased to announce that the NI-9244 single ended voltage input module can now be used with iTestSystem and NI CompactDAQ. The NI-9244 features 3 voltage inputs plus 1 neutral input, 24-bit resolution, 400 Vrms L-N, 800 Vrms L-L, 50 kS/s/ch,  in the C Series form factor.  The wide measurement range (400Vrms L-N or 800Vrms L-L) makes it ideal for high-voltage measurement applications such as phasor measurements, power metering, power quality monitoring, industrial machinery, motor testing, and transient or harmonic analysis with high-speed (50kHz) simultaneous sampling.

iTestSystem Info

For advice about using the NI-9244 in stand-a-lone power quality applications or cRIO power monitoring applications contact Mark Yeager.

https://itestsystem.com/wp-content/uploads/2018/06/NI-9244.png 628 1200 Mark Yeager https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Mark Yeager2018-06-04 15:16:222023-07-31 19:15:57ITM adds NI-9244 compatibility to iTestSystem

iTestSystem: New Release

in Announcements, Blog Posts/by Mark Yeager



We are excited to announce that a new version of iTestSystem is available for download.  This latest release provides engineers with a flexible measurement platform ideal for long term endurance testing, vibration analysis, off -highway vehicle condition monitoring and structural design validation.

We have added  and updated the following tools:

  • Advanced Triggering for collecting Trend Data
  • Expanded Data Acquisition Hardware Support including the NI cDAQ TSN Chassis
  • Automated Data Analysis through the Automated Analytics (A2) Tool
  • Enhanced Tools for Data Viewing & Analysis
  • New Data Management and Email Notification Services

Download the new version today!

Download Now!

For more information about the new version of iTestSystem or to request a demo contact Chase.Petzinger@iTestSystem.com.

 

https://itestsystem.com/wp-content/uploads/2018/04/iTestSystem16.png 628 1200 Mark Yeager https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Mark Yeager2018-04-02 09:30:112023-07-31 19:22:20iTestSystem: New Release

Marquette University’s Engineering Hall Data Acquisition System

in Case Study, Civil | Infrastructure/by Mark Yeager

A CASE STUDY of Marquette University’s Engineering Hall Monitoring System

Read more
https://itestsystem.com/wp-content/uploads/2021/01/MUEngineering.png 628 1200 Mark Yeager https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Mark Yeager2018-01-10 11:00:002023-07-26 18:12:13Marquette University’s Engineering Hall Data Acquisition System

ITM Presents Industrial IOT Edge Nodes at NIWeek 2017 Keynote

in Announcements, Blog Posts, Video/by Mark Yeager

Watch ITM’s Ryan Welker on stage at NIWeek 2017 Day2 Keynote as he describes the advantages of using the new NI Time Sensitive Networking (TSN) technology.  The TSN technology he describes is embedded in the new CompactDAQ chassis (cDAQ-9185 and cDAQ-9189),  which are compatible with ITM’s iTestSystem software.  iTestSystem enables users to integrate these new devices into intelligent edge solutions.  Visit iTestSystem.com for more information about iTestSystem and Industrial IOT.

https://itestsystem.com/wp-content/uploads/2017/05/RW_NIWeek_2017.png 628 1200 Mark Yeager https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Mark Yeager2017-05-26 13:15:332021-07-13 18:25:04ITM Presents Industrial IOT Edge Nodes at NIWeek 2017 Keynote

ITM @ NI Week: Booth 809C in the Tools Network Pavilion

in Announcements, Blog Posts/by Mark Yeager

Come visit us at Booth 809C in the Tools Network Pavilion to learn more about iTestSystem, ITM’s structural data acquisition and analysis software.  Ryan Welker, Mark Yeager, and Chase Petzinger will be demonstrating iTestSystem’s current and new capabilities.

Download a free version of iTestSystem from the Tools Network or our Website

https://itestsystem.com/wp-content/uploads/2017/05/NIWeek2017-1.png 628 1200 Mark Yeager https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Mark Yeager2017-05-16 13:10:172021-01-14 23:32:36ITM @ NI Week: Booth 809C in the Tools Network Pavilion

ITM Starts Free iTestSystem Webinar Series

in Announcements, Blog Posts/by Mark Yeager

iTestsystem Webinar Capture

iTestSystem is ITM’s structural data acquisition and analysis software.  We are starting an online iTestSystem Webinar Series.  The goal for this series of webinars is to introduce iTestSystem’s capabilities to new users and refresh experienced users’ application fluency.

Come join us online for the inaugural iTestSystem Webinar: General Overview and Applications.  In this webinar Chase Petzinger and Mark Yeager will introduce the iTestSystem Software platform’s capabilities and discuss the types of applications where it can be applied.

iTestSystem Webinar: iTestSystem General Overview and Applications

When: March 28th, 2017 @ 11:00 EST

Where: Online Meeting*

*Register now while space is still available.

 

Register for this iTestSystem Webinar

 

https://itestsystem.com/wp-content/uploads/2018/12/NIMaxEthernet.png 628 1200 Mark Yeager https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Mark Yeager2017-03-15 13:05:222021-01-14 23:35:11ITM Starts Free iTestSystem Webinar Series

ITM adds NI-9217 compatibility to iTestSystem

in Announcements, Blog Posts, iTestSystem Tips/by Mark Yeager

NI 9217 RTD cDAQ Module

We are pleased to announce that the NI-9217 resistance temperature detector (RTD) analog input module can now be used with iTestSystem and NI CompactDAQ.  The NI-9217 features 4 analog inputs, 24-bit resolution, and an aggregate sampling rate of 5 S/s (1.25 S/s per channel) in high accuracy mode.  The high accuracy mode has built in 50/60 Hz noise rejection and less than a 1 °C accuracy error over its entire operating temperature range.

Tip: Since the NI-9217 is the first CompactDAQ RTD module on the compatibility list,  a new RTD channel type was added to iTestSystem.  Right click on Channels in the project tree and select Create New > RTD.

For more information, visit https://3.133.116.34

https://itestsystem.com/wp-content/uploads/2016/12/NI-9217.png 628 1200 Mark Yeager https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Mark Yeager2016-12-27 13:30:252021-01-08 23:41:13ITM adds NI-9217 compatibility to iTestSystem

Smart structures: If walls could talk

in Announcements, Blog Posts/by Tim Carlier

Marquette University Engineering

Sensors in Marquette University’s Engineer Hall provide students with an interactive learning center.

By Robert Farrell

https://csengineermag.com/article/smart-structures-if-walls-could-talk/

I would like to give a special thanks to all those who contributed to the success of  this project.

Related link: Custom Software Integration Allows for Novel Monitoring System for Instrumented Educational Building — A CASE STUDY of Marquette University’s Engineering Hall

https://itestsystem.com/wp-content/uploads/2021/01/MUEngineering-1.png 628 1200 Tim Carlier https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Tim Carlier2016-10-11 19:13:282021-01-14 23:35:32Smart structures: If walls could talk

Tip: Adding Cursors to TestView+ Graphs

in iTestSystem Tips/by Tim Carlier

testview-cursor

Quickly add cursors to your iTestSystem’s TestView+ graph by right clicking near the location that you want to add the cursor and select Cursors: Add Cursor.

Click here or point your browser to /products/software/itestsystem-20-0/ to download your free copy.

https://itestsystem.com/wp-content/uploads/2016/10/TestView-Plus-Graph-Cursors.png 628 1200 Tim Carlier https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Tim Carlier2016-10-04 23:24:052023-09-11 18:42:48Tip: Adding Cursors to TestView+ Graphs

Tip: Viewing data in TestView Plus

in Blog Posts, iTestSystem Tips/by Tim Carlier

testview-plus4

 

Quickly view your test data in iTestSystem’s TestView+ application by selecting your graph type and adding channels using the quick drag and drop feature. Zoom in to take a closer look or select a new tab to create a new graph.

Download iTestSystem
https://itestsystem.com/wp-content/uploads/2016/09/TestView-Plus-Data-Viewer.png 628 1200 Tim Carlier https://itestsystem.com/wp-content/uploads/2020/05/itmlogo_Horizontal_3x1.png Tim Carlier2016-09-20 02:46:032021-01-09 00:36:22Tip: Viewing data in TestView Plus
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